X-ray fluorescence spectrometer is an analytical instrument that uses characteristic X-ray fluorescence rays generated by X-ray excitation of elements in a sample to detect the energy and quantity of photons. This allows for qualitative and quantitative analysis, enabling fast and non-destructive testing.

Basic principles of X-ray fluorescence spectrometer:

X-ray fluorescence refers to the X-rays emitted by an analyzed sample under X-ray irradiation, containing information about the chemical composition of the sample. Analyzing this X-ray fluorescence helps determine the content of various components in the measured sample, constituting the X-ray fluorescence analyzer. Based on the knowledge of atomic physics, each chemical element has its specific energy level structure, with its outer electrons orbiting in fixed orbits with unique energies. When inner-shell electrons are dislodged from the atomic binding by sufficiently energetic X-ray irradiation, they become free electrons, causing the atom to be excited, entering an excited state. At this point, other outer-shell electrons fill this vacancy, causing a transition, releasing energy in the form of emitted X-rays.

Because the atomic energy level structure of each element is specific, the energy released when it transitions after excitation emits characteristic X-rays—each specific to that element. By measuring the energy of these characteristic X-rays, the presence of the corresponding element can be determined. Additionally, the intensity of these characteristic X-rays (or the quantity of X-ray photons) represents the content or concentration of that element.

What measurements can the XRF analyzer perform?

Analysis of coating composition and thickness

Precise testing of multilayers: analysis of thickness and composition of multilayer alloys, upper and lower layers with repeated light element coatings and organic material coatings, and infiltration layers.

ROHS environmental testing scheme

Detection of various heavy metals and hazardous elements, with detection limits reaching below 1ppm in testing.

Comprehensive elemental analysis

Capable of conducting elemental analysis on various alloys, ores, soils, jewelry, and more.

The X-ray fluorescence spectrometer (XRF) finds application across various fields. For instance, the Elite instrument X-ray fluorescence spectrometer is widely used in several industries such as fasteners, precious metals, semiconductor manufacturing, automotive components, electroplating solutions, electronic components, and the emerging new energy sector.

How to choose a suitable X-ray fluorescence spectrometer (XRF)?

Assessing Instrument Capabilities:

Determine if the XRF spectrometer meets usage needs for element identification, coating inspection, precise positioning, and production control.

Evaluating Product Performance:

Minimum Measurement Area: Reliable measurement results depend on ensuring that the excitation X-ray beam completely irradiates the target point on the sample. Therefore, controlling the size of the beam spot is crucial. A smaller spot size is harder to focus.

Complexity of Measurable Sample Shapes: Due to variations in X-ray emission intensity and beam size at different distances, coupled with changes in the angles and distances for receiving characteristic X-ray fluorescence, measurement results can significantly deviate. A good spectrometer should handle not only small samples but also diverse shapes and positions such as concave surfaces, cup bottoms, and complex geometries like L-shaped interiors.

A. Non-vertical optical path: Suitable for simple coatings with uniformly distanced samples.

B. Vertical optical path with Z-axis movement for focusing: Useful for slightly irregular samples with height differences of around 20mm.

C. Zoom + focus capabilities: Capable of handling various sizes and shapes, including curved surfaces and deep grooves up to 0-90mm, even for highly irregular samples with inconsistent peaks and valleys.

Sample Composition Structure: A reliable XRF spectrometer should not only test various sample sizes and shapes but also analyze more elements’ compositions and coating thicknesses.

Probe Type Selection:

Different probe types have distinct features. For instance, magnetic induction probes suit thicker metal coatings, while eddy current probes work for measuring non-conductive material thickness. Choose the appropriate probe type based on specific measurement needs.

Display and Operation Methods:

Different instruments come with various display and operation methods, such as digital or analog displays. Consider user habits and convenience when selecting.

Brand Reputation and Price:

Finally, consider factors like brand reputation, price, and overall reliability to select a desktop film thickness measurement instrument that aligns with actual needs and offers reasonable pricing and quality.

Why choose the Elite Instrument X-ray fluorescence spectrometer?

· EFP Multi-Iteration Algorithm: Utilizes iterative calculations involving emission, absorption, scattering, and secondary fluorescence of characteristic X-rays. This allows analysis of emission spectra and light elements that would typically go undetected by other detectors, broadening the analysis scope and enhancing precision.

· Vertical Optical Path System: Uniquely designed optical path exchange mechanism by Elite Instrument ensures X-rays and visible light travel along the same vertical line. Coupled with embedded integrated multi-collimator holes and filter switching devices, it minimizes X-ray dispersion. The system, in tandem with EFP software, achieves focusing and zooming, facilitating testing of samples with various shapes and surface irregularities. The integrated optical path exchange mechanism and receiver angle reduction diminish errors caused by arc inclination in half. Additionally, characteristic X-rays can penetrate thicker surface layers.

· Automated Intelligent Detection: Allows unmanned operation with a robotic arm for sample retrieval. Features a programmable automatic displacement platform capable of efficiently testing thousands of samples with one programming session. Incorporates AI-powered automatic imaging for pinpointing, automatically matching test positions based on programmed profiles, simplifying mass sample testing.

· Micro-area Precise Positioning: Integrates high-density gathering technology, zoom ranging devices, and closed-loop control platforms, combined with image recognition for micrometer-level precise positioning measurements.

· Long Instrument Lifespan: Incorporates advanced industrial design and ergonomic principles with modular internal design layout for easy calibration, maintenance, and component replacement. Offers seamless upgrades, ensuring a machine that remains as good as new even after a decade of use. Combines upper computer operations with embedded software control for intelligent regulation of high voltage and heat dissipation according to testing needs and environmental changes. Significantly lower power consumption compared to conventional spectrometers, around 1/3, conserving energy and prolonging lifespan.

· Simple and Rapid Testing without Sample Damage: Enables quick and non-destructive testing by placing samples on the platform. Yields accurate and stable results within seconds—just place and test, ensuring swift and convenient analysis.

· Fast Non-Destructive Testing of Small Areas and Irregular Shapes: Utilizes a highly integrated vertical optical path system with high-intensity four-focus technology, providing an ideal solution for testing various-sized and minute samples as well as irregularly shaped components.

Frequently Asked Questions (FAQs):

Q: What are the precautions for using an X-ray fluorescence spectrometer?

A:Ensure the instrument’s power supply voltage matches the voltage specified on the instrument nameplate. The instrument must be connected to a grounded socket using a three-pin plug.

Since the film thickness analyzer is a precision instrument, it’s recommended to have a high-precision stabilized power supply. Both the computer and instrument should be equipped with an Uninterruptible Power Supply (UPS).

It’s crucial to keep the film thickness analyzer isolated from electromagnetic environments.

The instrument is suitable for operation in environments with temperatures ranging from 10°C to 40°C (50°F to 104°F) and should be stored in temperatures from 0°C to 50°C (32°F to 122°F). The permissible humidity range for operation and storage is between 0% and 65% (non-condensing). Maintain consistent environmental temperature and humidity during operation.

Direct exposure to sunlight may cause the instrument’s temperature to exceed 50°C. Avoid operating or storing the instrument in such conditions to prevent heat-related damage.

To prevent short circuits, avoid direct contact between the instrument and liquids. If liquids enter the instrument, immediately power it off and have a technician inspect it before reusing it.

The film thickness analyzer should not be used in acidic environments or in potentially explosive situations.

Avoid soiling or scratching the sample holder or calibration standards, as this can cause reading errors.

Do not use any mechanical or chemical methods to clean contaminants from the sample holder or calibration standards. If necessary, gently wipe away dirt with a lint-free cloth.

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