Precious metals refer to metals with rare reserves in the Earth’s crust, high prices, chemical stability, solubility resistance, ductility, and a brilliant luster. Due to their wide range of uses and limited reserves, precious metals such as gold, silver, platinum, palladium, rhodium, palladium, ruthenium, and iridium are highly valued. Precious metal jewelry includes various accessories such as hair ornaments, necklaces, bracelets, rings, and earrings.

Scope of Precious Metal Detection:
Gold detection and gold product testing, platinum detection and platinum product testing, silver detection and silver product testing, rare metal detection and rare metal product testing, platinum group element ore detection, precious metal ore detection, etc.

Methods of Precious Metal Detection:
Non-destructive testing method – X-ray fluorescence spectroscopy: The principle of this method is that the surface layer of precious metal jewelry is excited by X-rays, emitting characteristic X-ray fluorescence spectra. By measuring the energy or wavelength of the characteristic spectra lines, qualitative analysis can be performed. Measurement of the spectral line intensity enables quantitative analysis.

Due to the high intrinsic value of precious metals, quality control during the production process is crucial. The selection of a convenient and precise spectrometer is of utmost importance to everyone.

Elite XRF Supports Precious Metal Detection Solution:
XAU-4CS X-ray fluorescence spectrometer allows rapid non-destructive, efficient, and precise measurement of products. It offers various collimators for selection, a unique zooming device, and a position compensation algorithm for testing irregular or grooved samples.

Advantages of the Solution:

  1. High Precision: Minimum measurement area of 0.03mm².
  2. High Efficiency: High-precision XY mobile slide, achieving precise displacement and simultaneous detection of multiple points and samples. The movement accuracy is 10μm, easily handling the detection of tiny samples.
  3. High Performance: Equipped with a high-performance SDD silicon drift detector, achieving nanometer-level measurement accuracy.
  4. Multiple Collimators: Various collimator sizes can be chosen based on sample size for testing.
  5. Irregular and Grooved Sample Testing: XAU-4CS has a zooming device and a position compensation algorithm, allowing non-destructive testing of various irregular grooved samples with a groove depth of 0-30mm.
  6. Advanced Algorithm: Utilizes a proprietary EFP algorithm for the coating of Li(3)-U(92) elements, accurately measuring multiple layers and elements, even when the same element is present in different layers.

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